<i>Advances in Imaging and Electron Physics, Volume 226</i> merges two long-running serials,<i> Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy</i>. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Pris: kr 2199.00 fra Norli
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<P>This introductory, yet in-depth, book explains the physical principles of electronic imaging and sensing and provides the reader with the information necessary to understand the design, operation, and practical applications of contemporary electronic...
kr 899.00
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This volume summarizes the state of the experimental and theoretical development in the area of physics of the electron solid, and attempts to condense the great amount of research published in various journals. It also includes experimental results which...
kr 489.00
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The <i>Advances in Chemical Physics</i> series provides the chemical physics field with a forum for critical, authoritative evaluations of advances in every area of the discipline. This volume explores the following topics: <ul><li>Thermodynamic...
kr 2199.00
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